{"created":"2023-05-15T12:36:39.501311+00:00","id":1486,"links":{},"metadata":{"_buckets":{"deposit":"ced2b56b-f0c2-4453-a4ad-cd2318ebdf5f"},"_deposit":{"created_by":2,"id":"1486","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1486"},"status":"published"},"_oai":{"id":"oai:kutarr.kochi-tech.ac.jp:00001486","sets":["28:36"]},"author_link":["4128","4127","4129","4126"],"item_7_alternative_title_21":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Logic stabilization of open fault LSI by laser irradiation"}]},"item_7_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-07-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"56","bibliographicPageStart":"49","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"高知工科大学紀要"}]}]},"item_7_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"不安定な出力論理を有するフローティング･ゲート故障に対して出力論理値を固定化する実験を行った。実験はゲートオープン故障を作り込んだInverter回路に外部からレーザを照射する方式である。その結果、出力論理は“H”固定した。同時にIDD値も変動した。この変動値は正常状態の特性の動作点に一致した。レーザ照射を止めると特性は元の状態に戻った。この現象を検証するためにゲート電極を共通にしたInverter回路の一方側にレーザを照射し他方側の出力を測定した。その結果“H”に固定した。この実験はレーザを照射することで形成される電子がフローティング･ゲート電極へ入り込み電圧を低下させていると考える。単体Trによるレーザ照射実験と合わせてこの現象を述べる。","subitem_description_type":"Abstract"}]},"item_7_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"4128","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SANADA, Masaru"}]},{"nameIdentifiers":[{"nameIdentifier":"4129","nameIdentifierScheme":"WEKO"}],"names":[{"name":"YASUTOMI, Taiki"}]}]},"item_7_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"高知工科大学"}]},"item_7_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11954573","subitem_source_identifier_type":"NCID"}]},"item_7_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1348-4842","subitem_source_identifier_type":"ISSN"}]},"item_7_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"眞田, 克"}],"nameIdentifiers":[{"nameIdentifier":"4126","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安富, 泰輝"}],"nameIdentifiers":[{"nameIdentifier":"4127","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"rb8_049-056.pdf","filesize":[{"value":"1.7 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"rb8_049-056.pdf","url":"https://kutarr.kochi-tech.ac.jp/record/1486/files/rb8_049-056.pdf"},"version_id":"8f02dc53-224b-4780-af7d-ad404ae22e16"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"レーザ照射によるオープン故障LSIの倫理の固定化","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"レーザ照射によるオープン故障LSIの倫理の固定化"}]},"item_type_id":"7","owner":"2","path":["36"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-07-29"},"publish_date":"2011-07-29","publish_status":"0","recid":"1486","relation_version_is_last":true,"title":["レーザ照射によるオープン故障LSIの倫理の固定化"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-15T14:06:04.324872+00:00"}