{"created":"2023-05-15T12:36:39.710349+00:00","id":1489,"links":{},"metadata":{"_buckets":{"deposit":"c8096a55-c6e8-4b63-8e13-7b2a24570368"},"_deposit":{"created_by":2,"id":"1489","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1489"},"status":"published"},"_oai":{"id":"oai:kutarr.kochi-tech.ac.jp:00001489","sets":["28:36"]},"author_link":["4162","4163","4161","4160"],"item_7_alternative_title_21":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Deposition Temperature Dependences of Critical Current Properties for Rare-Earth Based High-Tc Superconductors with 1D-Defects"}]},"item_7_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-07-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"87","bibliographicPageStart":"81","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"高知工科大学紀要"}]}]},"item_7_description_4":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"希土類系高温超伝導薄膜における実用レベルの磁場中臨界電流密度の実現を目的として、第二相であるナノロッドを超伝導母相中に導入し、成膜温度が臨界電流特性（不可逆曲線、電流－電圧特性）に与える影響を明らかにした。ナノロッドが一次元欠陥として作用すれば、磁場中臨界電流密度の向上が期待される。不可逆曲線からは欠陥導入による磁束状態の変化を評価でき、また電流－電圧特性から超伝導組織の均一性・高性能性を表す臨界電流密度の空間分布を評価できる。Ba-Nb-O系ナノロッドを導入したErBa2Cu3Oy薄膜において、一次元欠陥導入時に特徴的なBoseグラス的磁束状態に起因した不可逆曲線が現れ、成膜温度によって不可逆曲線の振る舞い及び、臨界電流密度の空間分布が変化することを見出した。これらの結果は、成膜温度によってナノロッドの密度および形態が変化することにより、磁場中超伝導特性が大きく変化したことを示唆する。本研究から、磁場中送電能力の高い希土類系高温超伝導線材の製造プロセスの制御因子としての成膜温度の重要性が明らかとなった。","subitem_description_type":"Abstract"}]},"item_7_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"査読あり論文","subitem_description_type":"Other"}]},"item_7_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"4162","nameIdentifierScheme":"WEKO"}],"names":[{"name":"HARUTA, Masakazu"}]},{"nameIdentifiers":[{"nameIdentifier":"4163","nameIdentifierScheme":"WEKO"}],"names":[{"name":"HORII, Shigeru"}]}]},"item_7_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"高知工科大学"}]},"item_7_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11954573","subitem_source_identifier_type":"NCID"}]},"item_7_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1348-4842","subitem_source_identifier_type":"ISSN"}]},"item_7_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"春田, 正和"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"堀井, 滋"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"rb8_081-087.pdf","filesize":[{"value":"986.2 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"rb8_081-087.pdf","url":"https://kutarr.kochi-tech.ac.jp/record/1489/files/rb8_081-087.pdf"},"version_id":"6b7f7bd6-16cc-4329-b7b7-70ca96315eca"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"一次元欠陥を導入した希土類系高温超伝導薄膜における臨界電流特性の成膜温度依存性","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"一次元欠陥を導入した希土類系高温超伝導薄膜における臨界電流特性の成膜温度依存性"}]},"item_type_id":"7","owner":"2","path":["36"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-07-29"},"publish_date":"2011-07-29","publish_status":"0","recid":"1489","relation_version_is_last":true,"title":["一次元欠陥を導入した希土類系高温超伝導薄膜における臨界電流特性の成膜温度依存性"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-15T14:05:02.853740+00:00"}