{"created":"2023-05-15T12:36:41.418703+00:00","id":1514,"links":{},"metadata":{"_buckets":{"deposit":"5e338687-bdd7-4a8c-91ab-caacf17a2217"},"_deposit":{"created_by":2,"id":"1514","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1514"},"status":"published"},"_oai":{"id":"oai:kutarr.kochi-tech.ac.jp:00001514","sets":["28:37"]},"author_link":["4287","4286","4285","4284"],"item_7_alternative_title_21":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Influence of Density of States of ZnO film on Electrical Properties and Reliability of ZnO Thin-Film Transistors"}]},"item_7_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-07-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"35","bibliographicPageStart":"29","bibliographicVolumeNumber":"9","bibliographic_titles":[{"bibliographic_title":"高知工科大学紀要"}]}]},"item_7_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"4286","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Furuta, Mamoru"}]},{"nameIdentifiers":[{"nameIdentifier":"4287","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Shimakawa, Shin-ichi"}]}]},"item_7_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"高知工科大学"}]},"item_7_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11954573","subitem_source_identifier_type":"NCID"}]},"item_7_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1348-4842","subitem_source_identifier_type":"ISSN"}]},"item_7_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"古田, 守"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"島川, 伸一"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"rb9_029_035.pdf","filesize":[{"value":"874.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"rb9_029_035.pdf","url":"https://kutarr.kochi-tech.ac.jp/record/1514/files/rb9_029_035.pdf"},"version_id":"6c99cb7b-6194-43b4-a06d-d670092fe902"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"酸化亜鉛薄膜の欠陥準位密度が薄膜トランジスタの電気特性・信頼性へ与える影響","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"酸化亜鉛薄膜の欠陥準位密度が薄膜トランジスタの電気特性・信頼性へ与える影響"}]},"item_type_id":"7","owner":"2","path":["37"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-10-17"},"publish_date":"2012-10-17","publish_status":"0","recid":"1514","relation_version_is_last":true,"title":["酸化亜鉛薄膜の欠陥準位密度が薄膜トランジスタの電気特性・信頼性へ与える影響"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-15T13:59:54.043197+00:00"}