{"created":"2023-05-15T12:36:43.457660+00:00","id":1548,"links":{},"metadata":{"_buckets":{"deposit":"d373c96c-3a58-4676-88a2-77916e42cc61"},"_deposit":{"created_by":2,"id":"1548","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1548"},"status":"published"},"_oai":{"id":"oai:kutarr.kochi-tech.ac.jp:00001548","sets":["28:38"]},"author_link":["4413","4414","4416","4415"],"item_7_alternative_title_21":{"attribute_name":"その他のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Evaluation of LSI Inner Structure by Using Quasi-static Electrical Field Sensing Technology"}]},"item_7_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-07-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"120","bibliographicPageStart":"113","bibliographicVolumeNumber":"10","bibliographic_titles":[{"bibliographic_title":"高知工科大学紀要"}]}]},"item_7_description_5":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"研究ノート","subitem_description_type":"Other"}]},"item_7_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"4415","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SANADA, Masaru"}]},{"nameIdentifiers":[{"nameIdentifier":"4416","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ITO, Seigo"}]}]},"item_7_publisher_35":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"高知工科大学"}]},"item_7_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11954573","subitem_source_identifier_type":"NCID"}]},"item_7_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1348-4842","subitem_source_identifier_type":"ISSN"}]},"item_7_version_type_18":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"眞田, 克"}],"nameIdentifiers":[{"nameIdentifier":"4413","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"伊藤, 誠吾"}],"nameIdentifiers":[{"nameIdentifier":"4414","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"rb10_113-120.pdf","filesize":[{"value":"1.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"rb10_113-120.pdf","url":"https://kutarr.kochi-tech.ac.jp/record/1548/files/rb10_113-120.pdf"},"version_id":"65ae6a40-0bc7-4031-ad56-18d1ed725a07"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"準静電界センシングによるLSI内部構造の評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"準静電界センシングによるLSI内部構造の評価"}]},"item_type_id":"7","owner":"2","path":["38"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-11-15"},"publish_date":"2016-11-15","publish_status":"0","recid":"1548","relation_version_is_last":true,"title":["準静電界センシングによるLSI内部構造の評価"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-15T13:54:28.324021+00:00"}