@article{oai:kutarr.kochi-tech.ac.jp:00000060,
 author = {Sanada, Masaru},
 issue = {8-9},
 journal = {Microelectronics Reliability},
 month = {Aug},
 note = {A novel diagnosis method has been developed based on transistor operating point analysis. The method is worked by the way of fault logic propagation trace based on voltage value and the way of operation time setting of each gate circuit. The former way is to detect penetration current net result from fault, replace the net with impedance net, calculate voltage value of each node of the impedance net by OHM’s low, and then sequentially trace the fault logic propagation. The latter way is to set a standardized operation time at each gate circuit, and then, the virtual terminal is prepared at output point of gate unit. The proposed method makes it possible to detect not only signal propagation of each gate in order of time, but oscillation phenomenon brought by feedback fault.},
 pages = {1533--1538},
 title = {Voltage-based fault path tracing by transistor operating point analysis},
 volume = {48},
 year = {2008}
}