{"created":"2023-05-15T12:35:44.390182+00:00","id":643,"links":{},"metadata":{"_buckets":{"deposit":"ba96a212-228a-4819-a695-0fbfb044a83b"},"_deposit":{"created_by":2,"id":"643","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"643"},"status":"published"},"_oai":{"id":"oai:kutarr.kochi-tech.ac.jp:00000643","sets":["6"]},"author_link":["1881"],"item_4_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-09","bibliographicIssueDateType":"Issued"},"bibliographic_titles":[{}]}]},"item_4_date_granted_65":{"attribute_name":"学位授与年月日","attribute_value_mlt":[{"subitem_dategranted":"2018-09-25"}]},"item_4_degree_grantor_63":{"attribute_name":"学位授与機関","attribute_value_mlt":[{"subitem_degreegrantor":[{"subitem_degreegrantor_name":"高知工科大学"}],"subitem_degreegrantor_identifier":[{"subitem_degreegrantor_identifier_name":"26402","subitem_degreegrantor_identifier_scheme":"kakenhi"}]}]},"item_4_degree_name_62":{"attribute_name":"学位名","attribute_value_mlt":[{"subitem_degreename":"博士（学術）"}]},"item_4_description_6":{"attribute_name":"引用","attribute_value_mlt":[{"subitem_description":"高知工科大学, 博士論文.","subitem_description_type":"Other"}]},"item_4_dissertation_number_66":{"attribute_name":"学位授与番号","attribute_value_mlt":[{"subitem_dissertationnumber":"甲第341号"}]},"item_4_publisher_34":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"高知工科大学"}]},"item_4_text_37":{"attribute_name":"アドバイザー","attribute_value_mlt":[{"subitem_text_value":"橘,昌良"}]},"item_4_version_type_17":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"WANNABOON, Chatchai"}],"nameIdentifiers":[{"nameIdentifier":"1881","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"119800731989.pdf","filesize":[{"value":"9.9 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"博士論文全文","url":"https://kutarr.kochi-tech.ac.jp/record/643/files/119800731989.pdf"},"version_id":"f3c179ed-f1e9-46f4-856e-dca7bd3a2575"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"119800721989.pdf","filesize":[{"value":"193.7 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"審査結果の要旨","url":"https://kutarr.kochi-tech.ac.jp/record/643/files/119800721989.pdf"},"version_id":"60682fb9-018f-4412-b126-9e11a0f5043d"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-02-13"}],"displaytype":"detail","filename":"119800711989.pdf","filesize":[{"value":"204.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"論文内容の要旨","url":"https://kutarr.kochi-tech.ac.jp/record/643/files/119800711989.pdf"},"version_id":"1846d9ce-7fd8-45f1-ba3f-b9043f638e6a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"doctoral thesis","resourceuri":"http://purl.org/coar/resource_type/c_db06"}]},"item_title":"DEVELOPMENT DESIGN OF BUILT-IN SELF-TEST FOR LSI CIRCUITS: TEST PATTERN GENERATION, OSCILLATION-BASED TESTING, AND CALIBRATION TECHNIQUE","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DEVELOPMENT DESIGN OF BUILT-IN SELF-TEST FOR LSI CIRCUITS: TEST PATTERN GENERATION, OSCILLATION-BASED TESTING, AND CALIBRATION TECHNIQUE"}]},"item_type_id":"4","owner":"2","path":["6"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-12-19"},"publish_date":"2018-12-19","publish_status":"0","recid":"643","relation_version_is_last":true,"title":["DEVELOPMENT DESIGN OF BUILT-IN SELF-TEST FOR LSI CIRCUITS: TEST PATTERN GENERATION, OSCILLATION-BASED TESTING, AND CALIBRATION TECHNIQUE"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-05-15T13:29:20.195105+00:00"}