{"_buckets": {"deposit": "1ea00e50-5346-41d7-a788-22ecb7f70441"}, "_deposit": {"created_by": 2, "id": "1278", "owners": [2], "pid": {"revision_id": 0, "type": "depid", "value": "1278"}, "status": "published"}, "_oai": {"id": "oai:kutarr.kochi-tech.ac.jp:00001278", "sets": ["27"]}, "author_link": ["3403", "3402"], "item_5_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2017-07", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "2", "bibliographicVolumeNumber": "10", "bibliographic_titles": [{"bibliographic_title": "Society for Social Management Systems Internet Journal"}]}]}, "item_5_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "The electronic materials and electronics device industries remain important to Japan in spite of the general decline of the Japanese electronics industry. There is risk and uncertainty when developing functional materials in the electronics industry. However, studies examining the uncertainty and risk variables in the development of functional materials are scarce. This study examines incremental research and development (R\u0026D) developed for raw functional materials for electronics. Our analysis suggests that, as a result of R\u0026D and later industrialisation, the dominant variables are the scientific limits and the uncertainty of the object, an impossible production condition and unknowable marketability.", "subitem_description_type": "Abstract"}]}, "item_5_publisher_36": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Society for Social Management Systems"}]}, "item_5_source_id_11": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "2432-552X", "subitem_source_identifier_type": "ISSN"}]}, "item_5_version_type_19": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Chikamori, Yoji"}], "nameIdentifiers": [{"nameIdentifier": "3402", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nasu, Seigo"}], "nameIdentifiers": [{"nameIdentifier": "3403", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-02-13"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "SMS15-1374.pdf", "filesize": [{"value": "648.5 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 648500.0, "url": {"label": "SMS15-1374.pdf", "url": "https://kutarr.kochi-tech.ac.jp/record/1278/files/SMS15-1374.pdf"}, "version_id": "1ac9205b-b24a-4db4-abaa-7263ddb59034"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "development of functional material", "subitem_subject_scheme": "Other"}, {"subitem_subject": "uncertainty and risk", "subitem_subject_scheme": "Other"}, {"subitem_subject": "unexpected failure", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "conference paper", "resourceuri": "http://purl.org/coar/resource_type/c_5794"}]}, "item_title": "The Structural Characterisation of Risk in the R\u0026D Process of Functional Raw Materials for Electronic Devices", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "The Structural Characterisation of Risk in the R\u0026D Process of Functional Raw Materials for Electronic Devices"}]}, "item_type_id": "5", "owner": "2", "path": ["27"], "permalink_uri": "http://hdl.handle.net/10173/1858", "pubdate": {"attribute_name": "公開日", "attribute_value": "2018-02-06"}, "publish_date": "2018-02-06", "publish_status": "0", "recid": "1278", "relation": {}, "relation_version_is_last": true, "title": ["The Structural Characterisation of Risk in the R\u0026D Process of Functional Raw Materials for Electronic Devices"], "weko_shared_id": -1}