{"_buckets": {"deposit": "973a7fb7-c803-4e47-945e-8810cec3dc18"}, "_deposit": {"created_by": 2, "id": "143", "owners": [2], "pid": {"revision_id": 0, "type": "depid", "value": "143"}, "status": "published"}, "_oai": {"id": "oai:kutarr.kochi-tech.ac.jp:00000143", "sets": ["5"]}, "author_link": ["529", "530"], "item_2_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2010-01-01", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "42", "bibliographicPageStart": "33", "bibliographicVolumeNumber": "E93-D", "bibliographic_titles": [{"bibliographic_title": "IEICE Transactions on Information and Systems"}]}]}, "item_2_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "An analog circuit testing scheme is presented. The testing technique is a sinusoidal fault signature characterization, involving the measurement of DC offset, amplitude, frequency and phase shift, and the realization of two crossing level voltages. The testing system is an extension of the IEEE 1149.4 standard through the modification of an analog boundary module, affording functionalities for both on-chip testing capability, and accessibility to internal components for off-chip testing. A demonstrating circuit-under-test, a 4th-order Gm-C low-pass filter, and the proposed analog testing scheme are implemented in a physical level using 0.18-µm CMOS technology, and simulated using Hspice. Both catastrophic and parametric faults are potentially detectable at the minimum parameter variation of 0.5%. The fault coverage associated with CMOS transconductance operational amplifiers and capacitors are at 94.16% and 100%, respectively. This work offers the enhancement of standardizing test approach, which reduces the complexity of testing circuit and provides non-intrusive analog circuit testing.", "subitem_description_type": "Abstract"}]}, "item_2_publisher_35": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "The Institute of Electronics, Information and Communication Engineers"}]}, "item_2_relation_13": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1587/traninf.E93.D.33", "subitem_relation_type_select": "DOI"}}]}, "item_2_relation_44": {"attribute_name": "関係URI", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "http://search.ieice.org/"}], "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://search.ieice.org/", "subitem_relation_type_select": "URI"}}]}, "item_2_rights_14": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright © 2010 The Institute of Electronics, Information and Communication Engineers"}]}, "item_2_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA10826272@@@AA11510321", "subitem_source_identifier_type": "NCID"}]}, "item_2_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0916-8532@@@1745-1361", "subitem_source_identifier_type": "ISSN"}]}, "item_2_version_type_18": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "SAN-UM, Wimol"}], "nameIdentifiers": [{"nameIdentifier": "529", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "TACHIBANA, Masayoshi"}], "nameIdentifiers": [{"nameIdentifier": "530", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-02-13"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "IEICE_E93-D_1_33.pdf", "filesize": [{"value": "1.6 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1600000.0, "url": {"label": "IEICE_E93-D_1_33.pdf", "url": "https://kutarr.kochi-tech.ac.jp/record/143/files/IEICE_E93-D_1_33.pdf"}, "version_id": "4ade4c06-e419-4bda-9c3c-86bf3a733049"}]}, "item_keyword": {"attribute_name": "キーワード", "attribute_value_mlt": [{"subitem_subject": "analog circuit testing", "subitem_subject_scheme": "Other"}, {"subitem_subject": "circuit-under-test", "subitem_subject_scheme": "Other"}, {"subitem_subject": "IEEE 1149.4 standard", "subitem_subject_scheme": "Other"}, {"subitem_subject": "fault signature characterization", "subitem_subject_scheme": "Other"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard"}]}, "item_type_id": "2", "owner": "2", "path": ["5"], "permalink_uri": "http://hdl.handle.net/10173/747", "pubdate": {"attribute_name": "公開日", "attribute_value": "2011-10-20"}, "publish_date": "2011-10-20", "publish_status": "0", "recid": "143", "relation": {}, "relation_version_is_last": true, "title": ["Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard"], "weko_shared_id": -1}