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  1. 学術雑誌論文

Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard

http://hdl.handle.net/10173/747
http://hdl.handle.net/10173/747
e3b631ce-620f-48e6-8183-0cbb1e00ace8
名前 / ファイル ライセンス アクション
IEICE_E93-D_1_33.pdf IEICE_E93-D_1_33.pdf (1.6 MB)
Item type 学術雑誌論文 / Journal Article(1)
公開日 2011-10-20
タイトル
タイトル Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard
言語
言語 eng
キーワード
主題Scheme Other
主題 analog circuit testing
キーワード
主題Scheme Other
主題 circuit-under-test
キーワード
主題Scheme Other
主題 IEEE 1149.4 standard
キーワード
主題Scheme Other
主題 fault signature characterization
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 SAN-UM, Wimol

× SAN-UM, Wimol

WEKO 529

SAN-UM, Wimol

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TACHIBANA, Masayoshi

× TACHIBANA, Masayoshi

WEKO 530

TACHIBANA, Masayoshi

Search repository
抄録
内容記述タイプ Abstract
内容記述 An analog circuit testing scheme is presented. The testing technique is a sinusoidal fault signature characterization, involving the measurement of DC offset, amplitude, frequency and phase shift, and the realization of two crossing level voltages. The testing system is an extension of the IEEE 1149.4 standard through the modification of an analog boundary module, affording functionalities for both on-chip testing capability, and accessibility to internal components for off-chip testing. A demonstrating circuit-under-test, a 4th-order Gm-C low-pass filter, and the proposed analog testing scheme are implemented in a physical level using 0.18-µm CMOS technology, and simulated using Hspice. Both catastrophic and parametric faults are potentially detectable at the minimum parameter variation of 0.5%. The fault coverage associated with CMOS transconductance operational amplifiers and capacitors are at 94.16% and 100%, respectively. This work offers the enhancement of standardizing test approach, which reduces the complexity of testing circuit and provides non-intrusive analog circuit testing.
書誌情報 IEICE Transactions on Information and Systems

巻 E93-D, 号 1, p. 33-42, 発行日 2010-01-01
ISSN
収録物識別子タイプ ISSN
収録物識別子 0916-8532@@@1745-1361
書誌レコードID
収録物識別子タイプ NCID
収録物識別子 AA10826272@@@AA11510321
DOI
関連タイプ isIdenticalTo
識別子タイプ DOI
関連識別子 10.1587/traninf.E93.D.33
権利
権利情報 Copyright © 2010 The Institute of Electronics, Information and Communication Engineers
著者版フラグ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
出版者
出版者 The Institute of Electronics, Information and Communication Engineers
関係URI
識別子タイプ URI
関連識別子 http://search.ieice.org/
関連名称 http://search.ieice.org/
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