{"_buckets": {"deposit": "123640c0-6bbe-4235-b5d4-16a3cca9c834"}, "_deposit": {"created_by": 2, "id": "1431", "owners": [2], "pid": {"revision_id": 0, "type": "depid", "value": "1431"}, "status": "published"}, "_oai": {"id": "oai:kutarr.kochi-tech.ac.jp:00001431", "sets": ["34"]}, "author_link": ["3897", "3896"], "item_7_alternative_title_21": {"attribute_name": "その他のタイトル", "attribute_value_mlt": [{"subitem_alternative_title": "Improvement of Diagnosis Accuracy by Short Fault with Substrate Bias Effect and Resistance Value - Application of Voltage based Fault Diagnosis Technology -"}]}, "item_7_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2009-06-29", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "1", "bibliographicPageEnd": "103", "bibliographicPageStart": "97", "bibliographicVolumeNumber": "6", "bibliographic_titles": [{"bibliographic_title": "高知工科大学紀要"}]}]}, "item_7_full_name_3": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "3897", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "Sanada, Masaru"}]}]}, "item_7_publisher_35": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "高知工科大学"}]}, "item_7_source_id_11": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AA11954573", "subitem_source_identifier_type": "NCID"}]}, "item_7_source_id_9": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "1348-4842", "subitem_source_identifier_type": "ISSN"}]}, "item_7_version_type_18": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "眞田, 克"}], "nameIdentifiers": [{"nameIdentifier": "3896", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2019-02-13"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "rb6_097-103.pdf", "filesize": [{"value": "1.1 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 1100000.0, "url": {"label": "rb6_097-103.pdf", "url": "https://kutarr.kochi-tech.ac.jp/record/1431/files/rb6_097-103.pdf"}, "version_id": "852f990d-a3bf-4b44-979f-2baedd489ce5"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "jpn"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "departmental bulletin paper", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "基板バイアス効果とショート抵抗の導入による診断精度の向上 －電圧値ベースによる故障診断への適用－", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "基板バイアス効果とショート抵抗の導入による診断精度の向上 －電圧値ベースによる故障診断への適用－"}]}, "item_type_id": "7", "owner": "2", "path": ["34"], "permalink_uri": "http://hdl.handle.net/10173/441", "pubdate": {"attribute_name": "公開日", "attribute_value": "2009-08-31"}, "publish_date": "2009-08-31", "publish_status": "0", "recid": "1431", "relation": {}, "relation_version_is_last": true, "title": ["基板バイアス効果とショート抵抗の導入による診断精度の向上 －電圧値ベースによる故障診断への適用－"], "weko_shared_id": -1}