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酸化亜鉛薄膜の欠陥準位密度が薄膜トランジスタの電気特性・信頼性へ与える影響
http://hdl.handle.net/10173/906
http://hdl.handle.net/10173/906aa9a9cf9-1409-41a1-8f6a-f1d7a005c9af
名前 / ファイル | ライセンス | アクション |
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Item type | 紀要論文 / Departmental Bulletin Paper(1) | |||||
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公開日 | 2012-10-17 | |||||
タイトル | ||||||
タイトル | 酸化亜鉛薄膜の欠陥準位密度が薄膜トランジスタの電気特性・信頼性へ与える影響 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
古田, 守
× 古田, 守× 島川, 伸一 |
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著者別名 | ||||||
姓名 | Furuta, Mamoru | |||||
著者別名 | ||||||
姓名 | Shimakawa, Shin-ichi | |||||
書誌情報 |
高知工科大学紀要 巻 9, 号 1, p. 29-35, 発行日 2012-07-31 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 1348-4842 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11954573 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
その他のタイトル | ||||||
その他のタイトル | Influence of Density of States of ZnO film on Electrical Properties and Reliability of ZnO Thin-Film Transistors | |||||
出版者 | ||||||
出版者 | 高知工科大学 |