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非晶質 In–Ga–Zn–Oxヘテロ接合チャネル薄膜トランジスタのキャリア輸送特性および信頼性
https://doi.org/10.32149/00002151
https://doi.org/10.32149/00002151ad525c99-4266-4121-8e4d-91bd4facd88a
名前 / ファイル | ライセンス | アクション |
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
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公開日 | 2022-03-01 | |||||
タイトル | ||||||
タイトル | 非晶質 In–Ga–Zn–Oxヘテロ接合チャネル薄膜トランジスタのキャリア輸送特性および信頼性 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_db06 | |||||
資源タイプ | doctoral thesis | |||||
ID登録 | ||||||
ID登録 | 10.32149/00002151 | |||||
ID登録タイプ | JaLC | |||||
アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
著者 |
佐々木, 大地
× 佐々木, 大地 |
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著者別名 | ||||||
姓名 | SASAKI, Daichi | |||||
引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 高知工科大学, 博士論文. | |||||
書誌情報 | 発行日 2020-03 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
その他のタイトル | ||||||
その他のタイトル | Carrier transport properties and reliability of amorphous In–Ga–Zn–O heterojunction channel thin-film transistors | |||||
出版者 | ||||||
出版者 | 高知工科大学 | |||||
出版者(ヨミ) | ||||||
こうちこうかだいがく | ||||||
アドバイザー | ||||||
古田,守 | ||||||
学位名 | ||||||
学位名 | 博士(工学) | |||||
学位授与機関 | ||||||
学位授与機関識別子Scheme | kakenhi | |||||
学位授与機関識別子 | 26402 | |||||
学位授与機関名 | 高知工科大学 | |||||
学位授与年月日 | ||||||
学位授与年月日 | 2020-03-18 | |||||
学位授与番号 | ||||||
学位授与番号 | 甲第360号 | |||||
公開日(登録日) | ||||||
日付 | 2022-03-01 |