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Developments of Built-In Self Test and Calibration of Analog Mixed-Signal LSI for Catastrophic Failures and Parametric Variations
http://hdl.handle.net/10173/757
http://hdl.handle.net/10173/757fe47ecfc-02b7-4d54-a7c9-9cb3b20c4bbf
名前 / ファイル | ライセンス | アクション |
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||
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公開日 | 2011-12-08 | |||||
タイトル | ||||||
タイトル | Developments of Built-In Self Test and Calibration of Analog Mixed-Signal LSI for Catastrophic Failures and Parametric Variations | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_46ec | |||||
資源タイプ | thesis | |||||
著者 |
SAN-UM, Wimol
× SAN-UM, Wimol |
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内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 高知工科大学博士(工学) 平成22年9月30日授与 (甲第189号) | |||||
引用 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 高知工科大学, 博士論文. | |||||
書誌情報 | 発行日 2010-09 | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
その他のタイトル | ||||||
その他のタイトル | AMS-LSIのためのパラメータ変動と故障に対応したBISTとキャリブレーション方式に関する研究 | |||||
出版者 | ||||||
出版者 | 高知工科大学 | |||||
アドバイザー | ||||||
橘,昌良 | ||||||
学位授与番号 | ||||||
学位授与番号 | 26402甲第189号 |