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Fault diagnosis technology based on transistor behavior analysis for physical analysis
http://hdl.handle.net/10173/522
http://hdl.handle.net/10173/522a7b30946-f3ba-495d-8a55-207f1fc1e819
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
microrel_46_9-11_1575.pdf (644.8 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
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| 公開日 | 2010-09-02 | |||||
| タイトル | ||||||
| タイトル | Fault diagnosis technology based on transistor behavior analysis for physical analysis | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | journal article | |||||
| 著者 |
Sanada, M
× Sanada, M× Yoshizawa, Y |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The novel method has been developed to detect accuracy fault elements in transistor level circuit, analyzing the characteristics of circuit operation influenced on leakage fault and being combined with diagnosis software, based on switching level simulation. This method is based on behavior of CMOS transistor to which applied unstable voltage produced by leakage fault. Unsettled logic brings the transistor’s operation point to saturation area with multi-impedance value and forms penetration current nets passing through it. Output value on the net is calculated with each element impedance value and miss-logic signal is spread to output terminal. An evaluation of this technology corroborates to be precise method by using the circuit in which embedded arbitrary fault portions. |
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| 書誌情報 |
Microelectronics Reliability 巻 46, 号 9-11, p. 1575-1580, 発行日 2008-09 |
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| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 0026-2714 | |||||
| 書誌レコードID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA00738419 | |||||
| DOI | ||||||
| 関連タイプ | isVersionOf | |||||
| 識別子タイプ | DOI | |||||
| 関連識別子 | 10.1016/j.microrel.2006.07.023 | |||||
| 権利 | ||||||
| 権利情報 | Copyright © 2006 Published by Elsevier Ltd. | |||||
| 著者版フラグ | ||||||
| 出版タイプ | AM | |||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
| 出版者 | ||||||
| 出版者 | Elsevier | |||||
