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Voltage-based fault path tracing by transistor operating point analysis
http://hdl.handle.net/10173/523
http://hdl.handle.net/10173/523da4e79d1-b8cd-46d4-a00c-b46735be5580
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
microrel_48_8-9_1533.pdf (408.8 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||||
|---|---|---|---|---|---|---|---|---|
| 公開日 | 2010-09-02 | |||||||
| タイトル | ||||||||
| タイトル | Voltage-based fault path tracing by transistor operating point analysis | |||||||
| 言語 | ||||||||
| 言語 | eng | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | Diagnosis | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | Impedance | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | Fault path tracing | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | Transistor operating point analysis | |||||||
| キーワード | ||||||||
| 主題Scheme | Other | |||||||
| 主題 | Voltage | |||||||
| 資源タイプ | ||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||
| 資源タイプ | journal article | |||||||
| 著者 |
Sanada, Masaru
× Sanada, Masaru
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| 抄録 | ||||||||
| 内容記述タイプ | Abstract | |||||||
| 内容記述 | A novel diagnosis method has been developed based on transistor operating point analysis. The method is worked by the way of fault logic propagation trace based on voltage value and the way of operation time setting of each gate circuit. The former way is to detect penetration current net result from fault, replace the net with impedance net, calculate voltage value of each node of the impedance net by OHM’s low, and then sequentially trace the fault logic propagation. The latter way is to set a standardized operation time at each gate circuit, and then, the virtual terminal is prepared at output point of gate unit. The proposed method makes it possible to detect not only signal propagation of each gate in order of time, but oscillation phenomenon brought by feedback fault. | |||||||
| 書誌情報 |
Microelectronics Reliability 巻 48, 号 8-9, p. 1533-1538, 発行日 2008-08 |
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| ISSN | ||||||||
| 収録物識別子タイプ | ISSN | |||||||
| 収録物識別子 | 0026-2714 | |||||||
| 書誌レコードID | ||||||||
| 収録物識別子タイプ | NCID | |||||||
| 収録物識別子 | AA00738419 | |||||||
| DOI | ||||||||
| 関連タイプ | isVersionOf | |||||||
| 識別子タイプ | DOI | |||||||
| 関連識別子 | 10.1016/j.microrel.2008.07.055 | |||||||
| 権利 | ||||||||
| 権利情報 | Copyright © 2008 Elsevier Ltd All rights reserved. | |||||||
| 著者版フラグ | ||||||||
| 出版タイプ | AM | |||||||
| 出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||||
| 出版者 | ||||||||
| 出版者 | Elsevier | |||||||
