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Defect-oriented Built-In Self-Test for Analog Mixed-Signal Circuits
https://doi.org/10.32149/0002000021
https://doi.org/10.32149/00020000219b86d498-3e18-4e21-9938-ba8aea358087
名前 / ファイル | ライセンス | アクション |
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Item type | 学位論文 / Thesis or Dissertation(1) | |||||||
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公開日 | 2023-11-01 | |||||||
タイトル | ||||||||
言語 | en | |||||||
タイトル | Defect-oriented Built-In Self-Test for Analog Mixed-Signal Circuits | |||||||
言語 | ||||||||
言語 | eng | |||||||
資源タイプ | ||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_db06 | |||||||
資源タイプ | doctoral thesis | |||||||
ID登録 | ||||||||
ID登録 | 10.32149/0002000021 | |||||||
ID登録タイプ | JaLC | |||||||
著者 |
TANG Xiaobin
× TANG Xiaobin
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アドバイザー | ||||||||
en | ||||||||
Prof. TACHIBANA Masayoshi | ||||||||
学位授与機関 | ||||||||
言語 | ja | |||||||
学位授与機関名 | 高知工科大学 | |||||||
学位授与年度 | ||||||||
ja | ||||||||
2023年度 | ||||||||
学位授与年月日 | ||||||||
学位授与年月日 | 2023-09-20 |